| Title: |
Robust and Effective Metric Learning Using Capped Trace Norm: Metric Learning via Capped Trace Norm |
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| Alternative Article URLs: |
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| Authors: |
Zhouyuan Huo |
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University of Texas at Arlington, Department of Computer Science and Engineering
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| Feiping Nie |
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University of Texas at Arlington, Department of Computer Science and Engineering
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| Heng Huang |
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University of Texas at Arlington, Department of Computer Science and Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| NSF Award Numbers: |
1117965,
1302675,
1344152,
1356628
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| DBLP Key: |
conf/kdd/HuoNH16
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| Author Comments: |
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