ACM SIGSOFT Intl. Symposium on Software Testing and Analysis, ISSTA 2014


Article Details
Title: ARC++: effective typestate and lifetime dependency analysis
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Authors: Xusheng Xiao
  • NEC Labs America
  • North Carolina State University
Gogul Balakrishnan
  • NEC Labs America
Franjo Ivancic
  • Google, Inc.
Naoto Maeda
  • NEC Corporation
Aarti Gupta
  • NEC Labs America
Deepak Chhetri
  • NEC Technologies India Ltd.
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DBLP Key: conf/issta/XiaoBIMGC14
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