ACM SIGSOFT Intl. Symposium on Software Testing and Analysis, ISSTA 2016


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Title: A learning-to-rank based fault localization approach using likely invariants
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Authors: Tien-Duy B. Le
  • Singapore Management University, School of Information Systems
David Lo
  • Singapore Management University, School of Information Systems
Claire Le Goues
  • Carnegie Mellon University, School of Computer Science
Lars Grunske
  • Humboldt University of Berlin
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DBLP Key: conf/issta/LeLGG16
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