ACM SIGSOFT Intl. Symposium on Software Testing and Analysis, ISSTA 2018


Article Details
Title: Identifying implementation bugs in machine learning based image classifiers using metamorphic testing
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Authors: Anurag Dwarakanath
  • Accenture Technology Labs
Manish Ahuja
  • Accenture Technology Labs
Samarth Sikand
  • Accenture Technology Labs
Raghotham M. Rao
  • Accenture Technology Labs
R. P. Jagadeesh Chandra Bose
  • Accenture Technology Labs
Neville Dubash
  • Accenture Technology Labs
Sanjay Podder
  • Accenture Technology Labs
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DBLP Key: conf/issta/DwarakanathASRB18
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