ACM SIGSOFT Intl. Symposium on Software Testing and Analysis, ISSTA 2016


Article Details
Title: Zero-overhead profiling via EM emanations
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Authors: Robert Locke Callan
  • Georgia Tech, School of Electrical and Computer Engineering
Farnaz Behrang
  • Georgia Tech, School of Computer Science
Alenka G. Zajic
  • Georgia Tech, School of Electrical and Computer Engineering
Milos Prvulovic
  • Georgia Tech, School of Computer Science
Alessandro Orso
  • Georgia Tech, School of Computer Science
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NSF Award Numbers: 1318934, 1320717, 1161821
DBLP Key: conf/issta/CallanBZPO16
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