ACM/IEEE International Conference on Software Engineering, ICSE 2016

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Title: VDTest: an automated framework to support testing for virtual devices
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Authors: Tingting Yu
  • University of Kentucky Lexington, KY, 40506, USA, Dept. of Comp. Sci.
Xiao Qu
  • ABB Corporate Research Raleigh, NC, 27606, USA
Myra B. Cohen
  • Univ. of Nebraska - Lincoln Lincoln, NE, 68588, USA, Dept. of Comp. Sci. & Eng.
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NSF Award Numbers: 1464032, 1161767, 1205472
DBLP Key: conf/icse/YuQC16
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