ACM/IEEE International Conference on Software Engineering, ICSE 2016

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Title: Automated parameter optimization of classification techniques for defect prediction models
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Authors: Chakkrit Tantithamthavorn
  • Nara Institute of Science and Technology, Japan
Shane McIntosh
  • McGill University, Canada
Ahmed E. Hassan
  • Queen’s University, Canada
Kenichi Matsumoto
  • Nara Institute of Science and Technology, Japan
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DBLP Key: conf/icse/Tantithamthavorn16
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