ACM/IEEE International Conference on Software Engineering, ICSE 2017


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Title: A test-suite diagnosability metric for spectrum-based fault localization approaches
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Authors: Alexandre Perez
  • INESC TEC, Portugal, HASLab
  • University of Porto
  • Palo Alto Research Center, USA
Rui Abreu
  • University of Porto
  • INESC TEC, Portugal, HASLab
  • Palo Alto Research Center, USA
Arie van Deursen
  • Delft University of Technology, The Netherlands
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DBLP Key: conf/icse/PerezAD17
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