ACM/IEEE International Conference on Software Engineering, ICSE 2018


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Title: Are mutation scores correlated with real fault detection?: a large scale empirical study on the relationship between mutants and real faults
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Authors: Mike Papadakis
  • University of Luxembourg
Donghwan Shin
  • Korea Advanced Institute of Science and Technology
  • University of Luxembourg
Shin Yoo
  • Korea Advanced Institute of Science and Technology
Doo-Hwan Bae
  • Korea Advanced Institute of Science and Technology
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DBLP Key: conf/icse/PapadakisSYB18
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