Are mutation scores correlated with real fault detection?: a large scale empirical study on the relationship between mutants and real faults

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Title:	Are mutation scores correlated with real fault detection?: a large scale empirical study on the relationship between mutants and real faults
Article URLs:	https://doi.org/10.1145/3180155.3180183 http://ieeexplore.ieee.org/document/8453121
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Authors:	Mike Papadakis	University of Luxembourg
	Donghwan Shin	Korea Advanced Institute of Science and Technology University of Luxembourg
	Shin Yoo	Korea Advanced Institute of Science and Technology
	Doo-Hwan Bae	Korea Advanced Institute of Science and Technology
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DBLP Key:	conf/icse/PapadakisSYB18
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ACM/IEEE International Conference on Software Engineering, ICSE 2018