ACM/IEEE International Conference on Software Engineering, ICSE 2017


Article Details
Title: What causes my test alarm?: automatic cause analysis for test alarms in system and integration testing
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Authors: He Jiang
  • Dalian University of Technology, School of Software
  • Key Laboratory for Ubiquitous Network and Service Software of Liaoning Province
  • Wuhan University, State Key Lab of Software Engineering
Xiaochen Li
  • Dalian University of Technology, School of Software
Zijiang Yang
  • Western Michigan University
Jifeng Xuan
  • Wuhan University, State Key Lab of Software Engineering
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DBLP Key: conf/icse/JiangLYX17
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