Automatic text input generation for mobile testing

Article Details
Title:	Automatic text input generation for mobile testing
Article URLs:	https://doi.org/10.1109/ICSE.2017.65 http://doi.ieeecomputersociety.org/10.1109/ICSE.2017.65 http://dl.acm.org/citation.cfm?id=3097445
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Authors:	Peng Liu	IBM T. J. Watson Research Center, Yorktown Heights, New York, USA
	Xiangyu Zhang	Purdue University
	Marco Pistoia	IBM T. J. Watson Research Center, Yorktown Heights, New York, USA
	Yunhui Zheng	IBM T. J. Watson Research Center, Yorktown Heights, New York, USA
	Manoel Marques	IBM T. J. Watson Research Center, Yorktown Heights, New York, USA
	Lingfei Zeng	Purdue University
Sharing:	Unknown
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NSF Award Numbers:	1409668, 1320444, 1320306
DBLP Key:	conf/icse/0010ZPZMZ17
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ACM/IEEE International Conference on Software Engineering, ICSE 2017