| Title: |
Simultaneous Safe Screening of Features and Samples in Doubly Sparse Modeling |
| Article URLs: |
|
| Alternative Article URLs: |
|
| Authors: |
Atsushi Shibagaki |
-
Nagoya Institute of Technology, Nagoya, 466-8555, Japan
|
| Masayuki Karasuyama |
-
Nagoya Institute of Technology, Nagoya, 466-8555, Japan
|
| Kohei Hatano |
-
Kyushu University, Fukuoka, 819-0395, Japan
|
| Ichiro Takeuchi |
-
Nagoya Institute of Technology, Nagoya, 466-8555, Japan
|
| Sharing: |
Unknown
|
| Verification: |
Authors have
not verified
information
|
| Artifact Evaluation Badge: |
none
|
| Artifact URLs: |
|
| Artifact Correspondence Email Addresses: |
|
| NSF Award Numbers: |
|
| DBLP Key: |
conf/icml/ShibagakiKHT16
|
| Author Comments: |
|