| Title: |
A Kernelized Stein Discrepancy for Goodness-of-fit Tests |
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| Authors: |
Qiang Liu |
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Dartmouth College, NH, 03755, Computer Science
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| Jason D. Lee |
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University of California, Berkeley, CA 94709, Department of Electrical Engineering and Computer Science
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| Michael I. Jordan |
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University of California, Berkeley, CA 94709, Department of Electrical Engineering and Computer Science
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| Sharing: |
Unknown
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| Verification: |
Authors have
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none
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| NSF Award Numbers: |
1565796
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| DBLP Key: |
conf/icml/LiuLJ16
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| Author Comments: |
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