Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering

Article Details
Title:	Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering
Article URLs:	https://doi.org/10.1145/2660267.2660301 https://www.wikidata.org/entity/Q58461173
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Authors:	Markus Kammerstetter	Vienna University of Technology, Institute of Computer Aided Automation Vienna University of Technology, Automation Systems Group Vienna University of Technology, International Secure Systems Lab Vienna University of Technology, Hardware Security Lab
	Markus Muellner	Vienna University of Technology, Institute of Computer Aided Automation Vienna University of Technology, Automation Systems Group Vienna University of Technology, International Secure Systems Lab Vienna University of Technology, Hardware Security Lab
	Daniel Burian	Vienna University of Technology, Institute of Computer Aided Automation Vienna University of Technology, Automation Systems Group Vienna University of Technology, International Secure Systems Lab Vienna University of Technology, Hardware Security Lab
	Christian Platzer	Vienna University of Technology, Institute of Computer Aided Automation Vienna University of Technology, Automation Systems Group Vienna University of Technology, International Secure Systems Lab Vienna University of Technology, Hardware Security Lab
	Wolfgang Kastner	Vienna University of Technology, Institute of Computer Aided Automation Vienna University of Technology, Automation Systems Group
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DBLP Key:	conf/ccs/KammerstetterMBPK14
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ACM Computer and Communications Security, CCS 2014

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