ACM Computer and Communications Security, CCS 2014


Article Details
Title: Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering
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Authors: Markus Kammerstetter
  • Vienna University of Technology, Institute of Computer Aided Automation
  • Vienna University of Technology, Automation Systems Group
  • Vienna University of Technology, International Secure Systems Lab
  • Vienna University of Technology, Hardware Security Lab
Markus Muellner
  • Vienna University of Technology, Institute of Computer Aided Automation
  • Vienna University of Technology, Automation Systems Group
  • Vienna University of Technology, International Secure Systems Lab
  • Vienna University of Technology, Hardware Security Lab
Daniel Burian
  • Vienna University of Technology, Institute of Computer Aided Automation
  • Vienna University of Technology, Automation Systems Group
  • Vienna University of Technology, International Secure Systems Lab
  • Vienna University of Technology, Hardware Security Lab
Christian Platzer
  • Vienna University of Technology, Institute of Computer Aided Automation
  • Vienna University of Technology, Automation Systems Group
  • Vienna University of Technology, International Secure Systems Lab
  • Vienna University of Technology, Hardware Security Lab
Wolfgang Kastner
  • Vienna University of Technology, Institute of Computer Aided Automation
  • Vienna University of Technology, Automation Systems Group
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DBLP Key: conf/ccs/KammerstetterMBPK14
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