| Article Details | ||
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| Title: | Forensic Image Inspection Assisted by Deep Learning | |
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| Authors: | Felix Mayer |
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| Martin Steinebach |
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| Sharing: | Unknown | |
| Verification: | Authors have not verified information | |
| Artifact Evaluation Badge: | none | |
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| DBLP Key: | conf/IEEEares/MayerS17 | |
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